O'Shea, K.,J.,, Tracey, J., Bramsiepe, S. and Stamps, R.L. (2013) Probing nanowire edge roughness using an extended magnetic domain wall. Applied Physics Letters, 102(6), 062409. (doi: 10.1063/1.4792314)
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Publisher's URL: http://dx.doi.org/10.1063/1.4792314
Abstract
Using Lorentz transmission electron microscopy, a unique experiment is realised in which an extended magnetic domain wall in a ferromagnetic nanowire, strongly pinned at one end, is utilised as a local probe of the distribution of pinning sites along the nanowire edges. Fresnel imaging is used to examine the detailed de-pinning process and extract a distribution of pinning energies along the wire. The pinning sites were found to be randomly distributed with surprisingly little correlation between pinning site location and visible structural features along the wire edge.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Tracey, Mr John and Stamps, Professor Robert and O'Shea, Miss Kerry |
| Authors: | O'Shea, K.,J.,, Tracey, J., Bramsiepe, S., and Stamps, R.L. |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Applied Physics Letters |
| ISSN: | 0003-6951 |
| ISSN (Online): | 1077-3118 |
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