Simulation, fabrication and characterization of THz metamaterial absorbers

Grant, J. , McCrindle, I. and Cumming, D. (2012) Simulation, fabrication and characterization of THz metamaterial absorbers. Journal of Visualized Experiments, 70(e50114), (doi: 10.3791/50114)

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Abstract

Metamaterials (MM), artificial materials engineered to have properties that may not be found in nature, have been widely explored since the first theoretical and experimental demonstration of their unique properties. MMs can provide a highly controllable electromagnetic response, and to date have been demonstrated in every technologically relevant spectral range including the optical, near IR, mid IR, THz , mm-wave, microwave and radio bands. Applications include perfect lenses, sensors, telecommunications, invisibility cloaks and filters. We have recently developed single band, dual band and broadband THz metamaterial absorber devices capable of greater than 80% absorption at the resonance peak. The concept of a MM absorber is especially important at THz frequencies where it is difficult to find strong frequency selective THz absorbers. In our MM absorber the THz radiation is absorbed in a thickness of ~ λ/20, overcoming the thickness limitation of traditional quarter wavelength absorbers. MM absorbers naturally lend themselves to THz detection applications, such as thermal sensors, and if integrated with suitable THz sources (e.g. QCLs), could lead to compact, highly sensitive, low cost, real time THz imaging systems.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Cumming, Professor David and Grant, Dr James
Authors: Grant, J., McCrindle, I., and Cumming, D.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Journal of Visualized Experiments
ISSN (Online):1940-087X

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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
552421Monolithic Resonant TeraHertz DetectorsDavid CummingEngineering & Physical Sciences Research Council (EPSRC)EP/I017461/1ENG - ENGINEERING ELECTRONICS & NANO ENG