Radiation-hardened reconfigurable array with instruction roll-back

Chalamalasetti, S.R., Purohit, S., Margala, M. and Vanderbauwhede, W. (2010) Radiation-hardened reconfigurable array with instruction roll-back. IEEE Embedded Systems Letters, 2(4), pp. 123-126. (doi: 10.1109/LES.2010.2089428)

Abstract

This letter presents the design and evaluation of a coarse grained reconfigurable array, hardened against radiation induced transient errors. The architecture consists of an 8 × 8 array of reconfigurable cells, each provided with a built-in soft error detection and instruction roll-back control. We also present the communication management scheme between the processors in the presence of varying degrees of single event upsets. The impact on throughput while evaluating an 8 × 8 discrete wavelet transform (DWT) and 8 × 8 discrete cosine transform (DCT) are also presented.

• Item Type: Articles
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Vanderbauwhede, Professor Wim
• Authors: Chalamalasetti, S.R., Purohit, S., Margala, M., and Vanderbauwhede, W.
• College/School: College of Science and Engineering > School of Computing Science
• Journal Name: IEEE Embedded Systems Letters
• ISSN: 1943-0663