Radiation-hardened reconfigurable array with instruction roll-back

Chalamalasetti, S.R., Purohit, S., Margala, M. and Vanderbauwhede, W. (2010) Radiation-hardened reconfigurable array with instruction roll-back. IEEE Embedded Systems Letters, 2(4), pp. 123-126. (doi:10.1109/LES.2010.2089428)

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Abstract

This letter presents the design and evaluation of a coarse grained reconfigurable array, hardened against radiation induced transient errors. The architecture consists of an 8 × 8 array of reconfigurable cells, each provided with a built-in soft error detection and instruction roll-back control. We also present the communication management scheme between the processors in the presence of varying degrees of single event upsets. The impact on throughput while evaluating an 8 × 8 discrete wavelet transform (DWT) and 8 × 8 discrete cosine transform (DCT) are also presented.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Vanderbauwhede, Professor Wim
Authors: Chalamalasetti, S.R., Purohit, S., Margala, M., and Vanderbauwhede, W.
College/School:College of Science and Engineering > School of Computing Science
Journal Name:IEEE Embedded Systems Letters
ISSN:1943-0663

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