Meeting the design challenges of nano-CMOS electronics, design automation and test in Europe

Asenov, A. et al. (2008) Meeting the design challenges of nano-CMOS electronics, design automation and test in Europe. In: Workshop on Impact of Process Variability on Design and Test, Munich, Germany, 10-14 Mar 2008,

Asenov, A. et al. (2008) Meeting the design challenges of nano-CMOS electronics, design automation and test in Europe. In: Workshop on Impact of Process Variability on Design and Test, Munich, Germany, 10-14 Mar 2008,

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Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Millar, Dr Campbell and Sinnott, Professor Richard and Drysdale, Dr Timothy and Cumming, Professor David and Asenov, Professor Asen and Roy, Professor Scott
Authors: Asenov, A., Sinnott, R.O., Millar, C., Roy, S., Cumming, D.R.S., Drysdale, T.D., Furber, S., Edwards, D., Zwolinski, M., Tyrrell, A.M., Murray, A.F., Pickles, S., and Berry, D.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
University Services > IT Services > E-Science

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