Vallejo-Fernandez, G. and Chapman, J.N. (2010) Thermal stability of exchange bias nanostructures. Journal of Applied Physics, 107(9), 09D704. (doi: 10.1063/1.3340451)
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Abstract
The thermal stability of an array of square exchange bias nanoelements has been investigated as a function of both the element size and the microstructure of the antiferromagnetic layer. The thermal stability of the nanostructures is measured in terms of their median blocking temperature 〈TB〉. It is shown that, generally, 〈TB〉 is lower for nanostructures than for the equivalent thin film system. However, the opposite behavior can be observed depending on the measurement conditions, specifically the temperature of measurement and the setting temperature. These results emphasize the importance/limitations of the setting process in exchange bias systems.
Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Chapman, Professor John |
Authors: | Vallejo-Fernandez, G., and Chapman, J.N. |
College/School: | College of Science and Engineering > School of Physics and Astronomy |
Journal Name: | Journal of Applied Physics |
Publisher: | American Institute of Physics |
ISSN: | 0021-8979 |
Published Online: | 19 April 2010 |
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