Characterization of individual microdroplets by SERRS spectroscopy

Syme, C.D., Sirimuthu, N., Martino, C., Yusvana, R. and Cooper, J.M. (2012) Characterization of individual microdroplets by SERRS spectroscopy. Proceedings of the SPIE: The International Society for Optical Engineering, 8234, 82340I. (doi:10.1117/12.906374)

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Publisher's URL: http://dx.doi.org/10.1117/12.906374

Abstract

Raman spectroscopy and its various derivatives continue to offer the analyst fast, powerful, non-invasive and nondestructive means by which to identify multiple analytes simultaneously and in real time. By virtue of the huge enhancements possible in Raman scattering, generated by both surface enhancement and the resonance Raman effect, or when coupled with other techniques such as confocal microscopy, Raman spectroscopy is becoming more and more applicable to the types of assay being conducted in lab-on-a-chip applications, such as flow cytometry, cell patterning and trapping, and microarrays, all of which often involve the detection of extremely low quantities of analyte. Surface enhanced Raman scattering (SERS, or when coupled with the resonance Raman phenomenon, SERRS) spectroscopy has proven to be of particular use as a robust optical detection method in microfluidic environments. In this paper, we demonstrate the use of SERRS multiplex detection to quantitatively characterize individual microdroplets in a continuous stream whose contents are gradually varied using a bespoke pump control algorithm.

Item Type:Articles
Additional Information:SPIE Plasmonics in Biology and Medicine IX, San Francisco, USA, 21 Jan 2012
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Yusvana, Dr Rama and Syme, Dr Christopher and Cooper, Professor Jonathan
Authors: Syme, C.D., Sirimuthu, N., Martino, C., Yusvana, R., and Cooper, J.M.
College/School:College of Science and Engineering > School of Chemistry
College of Science and Engineering > School of Engineering > Biomedical Engineering
Journal Name:Proceedings of the SPIE: The International Society for Optical Engineering
Publisher:SPIE - The International Society for Optical Engineering
ISSN:0277-786X

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