Monitoring and tuning micro-ring properties using defect-enhanced silicon photodiodes at 1550 nm

Logan, D.F., Velha, P., Sorel, M., De La Rue, R.M. , Jessop, P.E. and Knights, A.P. (2012) Monitoring and tuning micro-ring properties using defect-enhanced silicon photodiodes at 1550 nm. IEEE Photonics Technology Letters, 24(4), pp. 261-263. (doi:10.1109/LPT.2011.2177453)

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Abstract

We report on the application of defect-enhanced silicon waveguide photodiodes operating at 1550 nm as power monitors for use in photonic integrated circuits. In-line monitors of 250-μm length provide an efficiency of 97 mA/W by absorbing only 8% of the optical mode. The monitors were integrated onto micro-ring waveguide ports to provide measures of optical resonance characteristics and a feedback to a thermal resonance tuner. The suitability of these photodetectors for control of micro-ring resonators is demonstrated.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Velha, Mr Philippe and Sorel, Professor Marc and De La Rue, Professor Richard
Authors: Logan, D.F., Velha, P., Sorel, M., De La Rue, R.M., Jessop, P.E., and Knights, A.P.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:IEEE Photonics Technology Letters
ISSN:1041-1135

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