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Determination of the anisotropy of Young's modulus using a coupled microcantilever array

Choubey, B., Boyd, E.J., Armstrong, I., and Uttamchandani, D. (2012) Determination of the anisotropy of Young's modulus using a coupled microcantilever array. Journal of Microelectromechanical Systems, 21 (5). pp. 1252-1260. ISSN 1057-7157 (doi:10.1109/JMEMS.2012.2205137)

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Abstract

This paper reports a simple technique to measure the anisotropy of the Young's modulus of MEMS materials using coupled cantilevers. The technique is demonstrated in single-crystal silicon with an array of cantilevers fabricated in (100) silicon following a “wagon wheel” configuration. The long axis of the cantilevers had different angular orientations to the [110] direction. The parasitic coupling due to undercut below the cantilevers, which is often observed during etching of MEMS, led to a collective behavior in the frequency response of the cantilevers. This collective behavior was used in association with an inverse eigenvalue analysis to obtain the Young's moduli for the different orientations. Further analysis of the technique relating to accuracy and precision required in the resonance frequency measurement has also been presented.

Item Type:Article
Status:Published
Refereed:Yes
Glasgow Author(s):Choubey, Dr Bhaskar
Authors: Choubey, B., Boyd, E.J., Armstrong, I., and Uttamchandani, D.
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Journal of Microelectromechanical Systems
ISSN:1057-7157
Published Online:18 July 2012

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