Wang, L., Schaffer, B., Craven, A.J., MacLaren, I. , Miao, S. and Reaney, I.M. (2011) Atomic scale structural and chemical quantification of non-stoichiometric defects in Ti and Bi doped BiFeO3. Microscopy and Microanalysis, 17(S2), pp. 1896-1897. (doi: 10.1017/S143192761101035X)
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Publisher's URL: http://dx.doi.org/10.1017/S143192761101035X
Abstract
BiFeO<sub>3</sub> has been the subject of intense interest in recent years on account of possible multiferroic properties. Recently, Reaney and co-workers demonstrated that rare-earth doping can induce the formation of antipolar order with similarities to the PbZrO<sub>3</sub> structure. This study reports for the first time studies of the atomic structure and chemistry of nanoscale defects in such materials.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | MacLaren, Dr Ian and Craven, Professor Alan |
| Authors: | Wang, L., Schaffer, B., Craven, A.J., MacLaren, I., Miao, S., and Reaney, I.M. |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Microscopy and Microanalysis |
| Publisher: | Cambridge University Press |
| ISSN: | 1431-9276 |
| Published Online: | 07 October 2011 |
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