Simulation and analysis of solenoidal ion sources

Alderwick, A.R., Jardine, A.P., Hedgeland, H., MacLaren, D.A., Allison, W. and Ellis, J. (2008) Simulation and analysis of solenoidal ion sources. Review of Scientific Instruments, 79, p. 123301. (doi:10.1063/1.3030858)

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Publisher's URL: http://dx.doi.org/10.1063/1.3030858

Abstract

We present a detailed analysis and simulation of solenoidal, magnetically confined electron bombardment ion sources, aimed at molecular beam detection. The aim is to achieve high efficiency for singly ionized species while minimizing multiple ionization. Electron space charge plays a major role and we apply combined ray tracing and finite element simulations to determine the properties of a realistic geometry. The factors controlling electron injection and ion extraction are discussed. The results from simulations are benchmarked against experimental measurements on a prototype source.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:MacLaren, Dr Donald
Authors: Alderwick, A.R., Jardine, A.P., Hedgeland, H., MacLaren, D.A., Allison, W., and Ellis, J.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Review of Scientific Instruments
Publisher:American Institute of Physics
ISSN:0034-6748
Copyright Holders:Copyright © 2008 American Institute of Physics
First Published:First published in Review of Scientific Instruments
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher.

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