Developments in nanowire scanning electrochemical - atomic force microscopy (SECM-AFM) probes

Burt, D.P., Dobson, P.S. , Weaver, J.M.R., Wilson, N.R., Unwin, P.R. and Macpherson, J.V. (2007) Developments in nanowire scanning electrochemical - atomic force microscopy (SECM-AFM) probes. In: IEEE Sensors Conference, Atlanta, GA, 28-31 Oct 2007, pp. 712-715. (doi:10.1109/ICSENS.2007.4388499)

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Abstract

Since its introduction, SECM-AFM has gained recognition as an extremely useful tool for a wide variety of analytical and imaging applications. We have developed a probe fabrication method that uses single-walled carbon nanotube bundles as a structural template for the formation of a nanowire at the apex of an AFM tip. Subsequent insulation of the probe and cutting across the nanowire yields a disc electrode of well-defined geometry. The probe apex geometry results in topographic information being obtained without causing damage to the electrode by contacting the substrate. Also, by placing the electrode at the apex, electric force imaging can also be realized. The probes are demonstrated to accurately identify active sites and locally generated species by combined topographic and electrochemical measurements on the sub-micron scale. The influence of the probe geometry on the diffusion of species from micrometer scale active sites will also be considered.

Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Burt, Dr David and Weaver, Professor Jonathan and Dobson, Dr Phil
Authors: Burt, D.P., Dobson, P.S., Weaver, J.M.R., Wilson, N.R., Unwin, P.R., and Macpherson, J.V.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
390741Batch Fabrication of single-walled carbon nanotube atomic force microscopy probes and nanowiresJonathan WeaverEngineering & Physical Sciences Research Council (EPSRC)EP/C518276/1Electronic and Nanoscale Engineering