Electrically tuneable spectral responsivity in gated silicon photodiodes

Abid, K., Wang, X., Khokhar, A. Z., Watson, S., Al-Hasani, S. and Rahman, F. (2011) Electrically tuneable spectral responsivity in gated silicon photodiodes. Applied Physics Letters, 99(23), p. 231104. (doi: 10.1063/1.3665613)

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Publisher's URL: http://dx.doi.org/10.1063/1.3665613

Abstract

We report the observation of electrically tuneable spectral responsivity in silicon-based photodetectors. The current flowing through a lateral p-i-n junction photodiode can be changed by changing either the gate bias or the intensity of incident light, with the devices exhibiting typical optical responsivities of 65 A/W. The peak sensitivity of the device can be changed over the entire visible region by changing the gate voltage in a 5 V range. This happens because with increasing gate bias, an accumulation layer of holes is pulled closer to the Si-SiO2 interface, enhancing the blue response of the device.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Watson, Dr Scott and Khokhar, Dr Ali and Abid, Mr Kamran and Rahman, Dr Faiz and Wang, Dr Xingsheng
Authors: Abid, K., Wang, X., Khokhar, A. Z., Watson, S., Al-Hasani, S., and Rahman, F.
College/School:College of Science and Engineering > School of Engineering > Biomedical Engineering
College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Applied Physics Letters
Publisher:American Institute of Physics
ISSN:0003-6951
ISSN (Online):1077-3118
Published Online:06 December 2011

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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
501811ENIAC MOdeling and DEsign of Reliable, process variation-aware Nanoelectronic devices, circuits and systems (MODERN)Asen AsenovEngineering & Physical Sciences Research Council (EPSRC)EP/G04130X/1Electronic and Nanoscale Engineering