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Surface Profilometry Based On Polarization Analysis

Lesso, J., Duncan, A., Sibbett, W., and Padgett, M. (1998) Surface Profilometry Based On Polarization Analysis. Optics Letters, 23 (23). pp. 1800-1802. ISSN 0146-9592 (doi:10.1364/OL.23.001800)

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Abstract

We report a novel algorithm for the analysis of interferometric images for surface profiling. The algorithm can be used with any interferometric system in which the two interfering beams are orthogonally polarized. The algorithm is based on a measurement of the polarization state and gives a unique value for the path difference that is not subject to the ambiguities associated with fringe counting or phase unwrapping. A detector array allows the polarization state and hence the height of every pixel in the image to be determined simultaneously. The concept is easily extended to enable one to obtain the profiles of moving surfaces from a single pulse of illumination.

Item Type:Article
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Padgett, Prof Miles
Authors: Lesso, J., Duncan, A., Sibbett, W., and Padgett, M.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Optics Letters
Journal Abbr.:Opt. Lett.
ISSN:0146-9592

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