Chirp Characterization of Semiconductor Mode-Locked Laser Pulses with a High-Sensitivity TPA Waveguide Detector Sonogram

Stolarz, P., Strain, M., Hou, L. , Bryce, A. and Sorel, M. (2010) Chirp Characterization of Semiconductor Mode-Locked Laser Pulses with a High-Sensitivity TPA Waveguide Detector Sonogram. In: 23rd Annual Meeting of the IEEE Photonics Society, Denver, Colorado, USA, 7-11 November 2010, pp. 114-115. (doi:10.1109/PHOTONICS.2010.5698784)

Stolarz, P., Strain, M., Hou, L. , Bryce, A. and Sorel, M. (2010) Chirp Characterization of Semiconductor Mode-Locked Laser Pulses with a High-Sensitivity TPA Waveguide Detector Sonogram. In: 23rd Annual Meeting of the IEEE Photonics Society, Denver, Colorado, USA, 7-11 November 2010, pp. 114-115. (doi:10.1109/PHOTONICS.2010.5698784)

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Abstract

We report on the chirp measurements of low peak power optical pulses, generated by AlGaInAs semiconductor mode-locked lasers at repetition frequency of 40 GHz, with a sonogram technique including high-sensitivity TPA waveguide detector.

Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Stolarz, Mr Piotr and Strain, Dr Michael and Hou, Dr Lianping and Bryce, Prof Ann and Sorel, Professor Marc
Authors: Stolarz, P., Strain, M., Hou, L., Bryce, A., and Sorel, M.
College/School:College of Science and Engineering > School of Engineering

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