Magnetization processes in single-layer and laminated CoFe films patterned into multiscale elements with write-head-like geometries

Kong, X., McVitie, S., Chapman, J.N., Weaver, J.M.R., O'Donnell, D.O. and Johnston, A.B. (2008) Magnetization processes in single-layer and laminated CoFe films patterned into multiscale elements with write-head-like geometries. Journal of Applied Physics, 104, 013925. (doi:10.1063/1.2952068)

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Publisher's URL: http:/dx.doi.org/10.1063/1.2952068

Abstract

Lorentz microscopy has been used to study the micromagnetic processes occurring during the reversal of multiscale single and multilayer CoFe elements. The elements, which have similar dimensions to write heads used in magnetic recording, typically have length scales varying from 10 µm in the element “core” down to 100 nm in the element “tip.” Marked differences both in the core and the tip regions are observed between single and multilayer elements. The results demonstrate clearly how the role played by shape anisotropy in complex elements can be effectively reduced by multilayering, allowing any anisotropy induced in the film during deposition to play a greater role in defining the resulting behavior.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McVitie, Professor Stephen and Kong, Dr Xiang and Weaver, Professor Jonathan and Chapman, Professor John
Authors: Kong, X., McVitie, S., Chapman, J.N., Weaver, J.M.R., O'Donnell, D.O., and Johnston, A.B.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Journal of Applied Physics
ISSN:0021-8979

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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
397871Establishing performance limits in ultra-small magnetic elementsJohn ChapmanEngineering & Physical Sciences Research Council (EPSRC)EP/C008154/1Science and Engineering College Senior Management