Transmission electron microscopy study of CoFe films with high saturation magnetization

Craig, B.R., McVitie, S. , Chapman, J.N., Johnson, A.B. and O'Donnell, D.O. (2006) Transmission electron microscopy study of CoFe films with high saturation magnetization. Journal of Applied Physics, 100(5), 053915. (doi: 10.1063/1.2337783)

Full text not currently available from Enlighten.

Publisher's URL:


Transmission electron microscopy (TEM) has been used to study magnetization processes in four high moment CoFe films. While all films were of similar total thickness, 50 nm, the differences between them were the inclusion or otherwise of a seed layer and the introduction of nonmagnetic spacers to form laminated films. The detailed reversal mechanism for easy and hard axis reversals of each film was investigated. As expected cross-tie walls were observed in the films with thicker CoFe layers and wall displacements between layers were seen with the introduction of one or more spacer layers. Magnetization dispersion was reduced as multilayering was introduced. In the laminated film with three spacer layers, defect areas where the local magnetization distribution differed markedly from the surrounding film were observed. Cross-sectional TEM showed that layer roughness increased through the stack and this was the probable cause of the localized magnetic anomalies.

Item Type:Articles
Keywords:cobalt alloys, metallic thin films, iron alloys, ferromagnetic materials, magnetic thin films, laminates, transmission electron microscopy, magnetisation reversal, magnetic moments, magnetic domain walls, surface roughness, interface roughness
Glasgow Author(s) Enlighten ID:McVitie, Professor Stephen and Chapman, Professor John
Authors: Craig, B.R., McVitie, S., Chapman, J.N., Johnson, A.B., and O'Donnell, D.O.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Journal of Applied Physics
Publisher:American Institute of Physics

University Staff: Request a correction | Enlighten Editors: Update this record

Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
397871Establishing performance limits in ultra-small magnetic elementsJohn ChapmanEngineering & Physical Sciences Research Council (EPSRC)EP/C008154/1Science and Engineering College Senior Management