Lorentz microscopy studies of domain wall trap structures

Brownlie, C., McVitie, S., Chapman, J.N. and Wilkinson, C.D.W. (2006) Lorentz microscopy studies of domain wall trap structures. Journal of Applied Physics, 100(3), 033902. (doi:10.1063/1.2227263)

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Publisher's URL: http://dx.doi.org/10.1063/1.2227263

Abstract

Domain wall traps of varying geometry have been studied using Lorentz microscopy in a transmission electron microscope. Electron beam lithography and lift-off were used to fabricate the elements whose shape allowed the formation of a head-to-head domain structure in the central section. Previous micromagnetic simulations have shown that different head-to-head configurations are possible depending on the width and thickness of the strip. In the majority of our in situ magnetizing experiments a vortex domain wall configuration was nucleated. This could be moved reproducibly between the ends of the element under fields of a few tens of oersted.

Item Type:Articles
Keywords:transmission electron microscopy, electron beam lithography, magnetic domain walls, micromagnetics
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McVitie, Professor Stephen and Chapman, Professor John
Authors: Brownlie, C., McVitie, S., Chapman, J.N., and Wilkinson, C.D.W.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Journal of Applied Physics
Publisher:American Institute of Physics
ISSN:0021-8979

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