Three-dimensional Electrical Property Mapping with Nanometer Resolution

Alekseev, A., Efimov, A., Lu, K. and Loos, J. (2009) Three-dimensional Electrical Property Mapping with Nanometer Resolution. Advanced Materials, 21(48), 4915-+. (doi:10.1002/adma.200901754)

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Item Type:Articles
Additional Information:Article
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Loos, Professor Joachim
Authors: Alekseev, A., Efimov, A., Lu, K., and Loos, J.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Advanced Materials
Publisher:Wiley - V C H Verlag GmbH & Co. KGaA
ISSN:0935-9648
ISSN (Online):1521-4095

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