Alekseev, A., Efimov, A., Lu, K. and Loos, J. (2009) Three-dimensional Electrical Property Mapping with Nanometer Resolution. Advanced Materials, 21(48), 4915-+. (doi: 10.1002/adma.200901754)
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Item Type: | Articles |
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Additional Information: | Article |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Loos, Professor Joachim |
Authors: | Alekseev, A., Efimov, A., Lu, K., and Loos, J. |
College/School: | College of Science and Engineering > School of Physics and Astronomy |
Journal Name: | Advanced Materials |
Publisher: | Wiley - V C H Verlag GmbH & Co. KGaA |
ISSN: | 0935-9648 |
ISSN (Online): | 1521-4095 |
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