Conductive atomic force microscopy (C-AFM) analysis of photoactive layers in inert atmosphere

Alexeev, A. and Loos, J. (2008) Conductive atomic force microscopy (C-AFM) analysis of photoactive layers in inert atmosphere. Organic Electronics, 9(1), pp. 149-154. (doi:10.1016/j.orgel.2007.10.003)

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Item Type:Articles
Additional Information:Article
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Loos, Professor Joachim
Authors: Alexeev, A., and Loos, J.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Organic Electronics

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