Alexeev, A. and Loos, J. (2008) Conductive atomic force microscopy (C-AFM) analysis of photoactive layers in inert atmosphere. Organic Electronics, 9(1), pp. 149-154. (doi: 10.1016/j.orgel.2007.10.003)
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| Item Type: | Articles |
|---|---|
| Additional Information: | Article |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Loos, Professor Joachim |
| Authors: | Alexeev, A., and Loos, J. |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Organic Electronics |
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