Roy, S. (2010) Influence of atomic fluctuation on operation nanoscaled devices. In: 6th International SemiOI Workshop, Kiev, Ukraine, 26-30 April 2010,
Full text not currently available from Enlighten.
Item Type: | Conference Proceedings |
---|---|
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Roy, Professor Scott |
Authors: | Roy, S. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
University Staff: Request a correction | Enlighten Editors: Update this record