Influence of atomic fluctuation on operation nanoscaled devices

Roy, S. (2010) Influence of atomic fluctuation on operation nanoscaled devices. In: 6th International SemiOI Workshop, Kiev, Ukraine, 26-30 April 2010,

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Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Roy, Professor Scott
Authors: Roy, S.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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