Potential mapping of UHV cleaved functional III-V MOSCAPs with Kelvin probe force microscopy

Melitz, W., Shen, J., Lee, S., Bentley, S., Macintyre, D., Holland, M., Thayne, I. and Kummel, A. (2010) Potential mapping of UHV cleaved functional III-V MOSCAPs with Kelvin probe force microscopy. In: J: Materials and Devices for Beyond CMOS Scaling, San Francisco, USA, 6 April 2010,

Melitz, W., Shen, J., Lee, S., Bentley, S., Macintyre, D., Holland, M., Thayne, I. and Kummel, A. (2010) Potential mapping of UHV cleaved functional III-V MOSCAPs with Kelvin probe force microscopy. In: J: Materials and Devices for Beyond CMOS Scaling, San Francisco, USA, 6 April 2010,

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Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Thayne, Professor Iain and Macintyre, Dr Douglas and Bentley, Dr Steven and Holland, Dr Martin
Authors: Melitz, W., Shen, J., Lee, S., Bentley, S., Macintyre, D., Holland, M., Thayne, I., and Kummel, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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