Melitz, W., Shen, J., Lee, S., Bentley, S., Macintyre, D., Holland, M., Thayne, I. and Kummel, A. (2010) Potential mapping of UHV cleaved functional III-V MOSCAPs with Kelvin probe force microscopy. In: J: Materials and Devices for Beyond CMOS Scaling, San Francisco, USA, 6 April 2010,
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| Item Type: | Conference Proceedings |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Thayne, Prof Iain and Bentley, Dr Steven and Macintyre, Dr Douglas and Holland, Dr Martin |
| Authors: | Melitz, W., Shen, J., Lee, S., Bentley, S., Macintyre, D., Holland, M., Thayne, I., and Kummel, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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