Gate stack processing effects on III-V nMOSFET performance

Ignatova, O., Macintyre, D.S. and Thoms, S. (2010) Gate stack processing effects on III-V nMOSFET performance. In: 19th European Workshop on Heterostructure Technology, Crete, Greece, 18-20 Oct 2010,

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Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Macintyre, Dr Douglas and Thoms, Dr Stephen
Authors: Ignatova, O., Macintyre, D.S., and Thoms, S.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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