Statistical nano CMOS variability and its impact on SRAM

Asenov, A. (2010) Statistical nano CMOS variability and its impact on SRAM. In: Singhee, A. and Rutenbar, R.A. (eds.) Extreme Statistics in Nanoscale Memory Design. Springer, pp. 17-50. ISBN 9781441966056 (doi:10.1007/978-1-4419-6606-3_3)

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Item Type:Book Sections
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Asenov, Professor Asen
Authors: Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Extreme Statistics in Nanoscale Memory Design
Publisher:Springer
ISBN:9781441966056

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