Simulation Study of Workfunction Variability in MOSFETs with Polycrystalline Metal Gates

Idris, N.M., Brown, A., Watling, J. and Asenov, A. (2010) Simulation Study of Workfunction Variability in MOSFETs with Polycrystalline Metal Gates. In: 11th International Conference on Ultimate Integration Silicon (ULIS), Glasgow, UK,

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Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Watling, Dr Jeremy and Brown, Mr Andrew and Asenov, Professor Asen
Authors: Idris, N.M., Brown, A., Watling, J., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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