A novel approach to the statistical generation of non-normal distributed PSP compact model parameters using a nonlinear power method

Kovac, U., Dideban, D., Cheng, B., Moezi, N., Roy, G. and Asenov, A. (2010) A novel approach to the statistical generation of non-normal distributed PSP compact model parameters using a nonlinear power method. In: 15th International Conference on Simulation of Semiconductor Preocesses and Devices (SISPAD), Bologna, Italy, 6-8 Sep 2010,

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Publisher's URL: http://www.sispad.org/sispad/browse-proceedings/sispad-2010.html

Abstract

Statistical variability (SV) is one of the fundamental limiting factors for future nano- CMOS scaling and integration of. Variability aware design is essential to achieve reasonable yield and reliability in the manufacture of circuit and systems. To develop effective variability aware design technologies it is essential to have a reliable and accurate statistical compact modeling strategy. In this study a nonlinear power method (NPM) based statistical compact modeling strategy is presented. The results indicate that statistical compact model parameters generated by a NPM approach are significantly better at capturing the tails and non-normal shape of statistical parameter distributions when compared with principal component analysis (PCA).

Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Roy, Dr Gareth and Asenov, Professor Asen and Cheng, Dr Binjie and Kovac, Mr Urban
Authors: Kovac, U., Dideban, D., Cheng, B., Moezi, N., Roy, G., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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