Characterisation of FeBSiC coated MFM tips using Lorentz electron tomography and MFM

Scott, J. , McVitie, S. , Ferrier, R.P., Heydon, G.P., Rainforth, W.M., Gibbs, M.R.J., Tucker, J.W., Davies, H.A. and Bishop, J.E.L. (1999) Characterisation of FeBSiC coated MFM tips using Lorentz electron tomography and MFM. IEEE Transactions on Magnetics, 35(5), pp. 3986-3988. (doi: 10.1109/20.800730)

Abstract

Magnetic force microscope (MFM) tips coated with an amorphous ferromagnetic alloy have been studied using MFM and Lorentz electron microscopy. Imaging a standard NIST hard disk sample in the MFM reveals that the character of the tips varies dramatically with film thickness. The stray field distributions of the tips were determined using Lorentz electron tomography, and were found to be consistent with the contrast observed by MFM.

• Item Type: Articles
• Additional Information: 1999 International Magnetics Conference (INTERMAG 99), KYONGJU, SOUTH KOREA, MAY 18-21, 1999
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: McVitie, Professor Stephen and Scott, Dr Jamie and Ferrier, Prof Robert
• Authors: Scott, J., McVitie, S., Ferrier, R.P., Heydon, G.P., Rainforth, W.M., Gibbs, M.R.J., Tucker, J.W., Davies, H.A., and Bishop, J.E.L.
• Subjects: Q Science > QC Physics
• College/School: College of Science and Engineering > School of Physics and Astronomy
• Journal Name: IEEE Transactions on Magnetics
• Journal Abbr.: IEEE Trans. Magn.
• ISSN: 0018-9464