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Characterisation of FeBSiC coated MFM tips using Lorentz electron tomography and MFM

Scott, J., McVitie, S., Ferrier, R.P., Heydon, G.P., Rainforth, W.M., Gibbs, M.R.J., Tucker, J.W., Davies, H.A., and Bishop, J.E.L. (1999) Characterisation of FeBSiC coated MFM tips using Lorentz electron tomography and MFM. IEEE Transactions on Magnetics, 35 (5). pp. 3986-3988. ISSN 0018-9464 (doi:10.1109/20.800730)

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Abstract

Magnetic force microscope (MFM) tips coated with an amorphous ferromagnetic alloy have been studied using MFM and Lorentz electron microscopy. Imaging a standard NIST hard disk sample in the MFM reveals that the character of the tips varies dramatically with film thickness. The stray field distributions of the tips were determined using Lorentz electron tomography, and were found to be consistent with the contrast observed by MFM.

Item Type:Article
Additional Information:1999 International Magnetics Conference (INTERMAG 99), KYONGJU, SOUTH KOREA, MAY 18-21, 1999
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Scott, Dr Jamie and McVitie, Dr Stephen and Ferrier, Prof Robert
Authors: Scott, J., McVitie, S., Ferrier, R.P., Heydon, G.P., Rainforth, W.M., Gibbs, M.R.J., Tucker, J.W., Davies, H.A., and Bishop, J.E.L.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:IEEE Transactions on Magnetics
Journal Abbr.:IEEE Trans. Magn.
ISSN:0018-9464

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