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Measurement of the capacitance-low temperature performance curve of a ceramic capacitor

Trainer, M. (1999) Measurement of the capacitance-low temperature performance curve of a ceramic capacitor. Cryogenics, 39 (10). pp. 887-889. ISSN 0011-2275 (doi:10.1016/S0011-2275(99)00114-9)

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Publisher's URL: http://dx.doi.org/10.1016/S0011-2275(99)00114-9

Abstract

Highly reproducible capacitance-low temperature performance curves in the temperature range 130-280 K were obtained for a commercial ceramic disk capacitor with a modified barium titanate dielectric. Presented here is the description of a cryostat and the design of a test fixture used with a microprocessor-controlled LCR meter. By using the test fixture the capabilities of the meter were considerably enhanced by allowing continuously changing capacitance to be accurately measured.

Item Type:Article
Status:Published
Refereed:Yes
Glasgow Author(s):Trainer, Mr Matthew
Authors: Trainer, M.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Research Group:Physics and Astronomy
Journal Name:Cryogenics
ISSN:0011-2275

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