Trainer, M. (2001) Measurement of the low temperature electrical properties of solid tantalum capacitors. Cryogenics, 41(4), pp. 285-288. (doi: 10.1016/S0011-2275(01)00098-4)
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Publisher's URL: http://dx.doi.org/10.1016/S0011-2275(01)00098-4
Abstract
Highly reproducible capacitance-low temperature and dissipation factor-low temperature curves were obtained for commercial solid tantalum electrolytic capacitors in the range 90-310 K. A description of a design of a cryostat used to test radial wire ended tantalum bead capacitors at low temperatures is given. The tantalum capacitors showed excellent capacitance-temperature linearity between 220 and 310 K for test frequencies of 120 Hz and 1 kHz. Some evidence is given for the presence of dielectric relaxation at ~210 K.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Trainer, Mr Matthew |
| Authors: | Trainer, M. |
| Subjects: | Q Science > QC Physics |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Research Group: | Physics and Astronomy |
| Journal Name: | Cryogenics |
| ISSN: | 0011-2275 |
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