Monte Carlo simulations of high-performance implant free In0.3Ga0.7 nano-MOSFETs for low-power CMOS applications

Kalna, K., Wilson, J.A., Moran, D.A.J., Hill, R.J.W., Long, A.R., Droopad, R., Passlack, M., Thayne, I.G. and Asenov, A. (2007) Monte Carlo simulations of high-performance implant free In0.3Ga0.7 nano-MOSFETs for low-power CMOS applications. IEEE Transactions on Nanotechnology, 6(1), pp. 106-112. (doi:10.1109/TNANO.2006.888543)

[img]
Preview
Text
paulines04063332.pdf

1MB

Abstract

No abstract available.

Item Type:Articles
Keywords:InGaAs nano-MOSFETs, Monte Carlo simulation, high performance, implant free
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Thayne, Professor Iain and Moran, Dr David and Asenov, Professor Asen and Kalna, Dr Karol
Authors: Kalna, K., Wilson, J.A., Moran, D.A.J., Hill, R.J.W., Long, A.R., Droopad, R., Passlack, M., Thayne, I.G., and Asenov, A.
Subjects:T Technology > T Technology (General)
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
University Centres > Glasgow Materials Research Initiative
Journal Name:IEEE Transactions on Nanotechnology
Publisher:IEEE
ISSN:1536-125X
ISSN (Online):1941-0085
Published Online:15 January 2007
Copyright Holders:Copyright © 2007 Institute of Electrical and Electronics Engineers (IEEE)
First Published:First published in IEEE Transactions on Nanotechnology 6(6):106-112
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

University Staff: Request a correction | Enlighten Editors: Update this record

Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
292091metamorphic GaAs HEMTs for High Bandwidth Wireless Communication ApplicationsIain ThayneEngineering & Physical Sciences Research Council (EPSRC)GR/A10994/01Electronic and Nanoscale Engineering
358573Sub 100nm 111-V MOSFET's for Digital ApplicationsIain ThayneEngineering & Physical Sciences Research Council (EPSRC)GR/S61218/01Electronic and Nanoscale Engineering