Evaluating the reliability of NAND multiplexing with PRISM

Norman, G. , Parker, P., Kwiatkowska, M. and Shukla, S. (2005) Evaluating the reliability of NAND multiplexing with PRISM. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 24(10), 1629 -1637. (doi:10.1109/TCAD.2005.852033)

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Abstract

Probabilistic-model checking is a formal verification technique for analyzing the reliability and performance of systems exhibiting stochastic behavior. In this paper, we demonstrate the applicability of this approach and, in particular, the probabilistic-model-checking tool PRISM to the evaluation of reliability and redundancy of defect-tolerant systems in the field of computer-aided design. We illustrate the technique with an example due to von Neumann, namely NAND multiplexing. We show how, having constructed a model of a defect-tolerant system incorporating probabilistic assumptions about its defects, it is straightforward to compute a range of reliability measures and investigate how they are affected by slight variations in the behavior of the system. This allows a designer to evaluate, for example, the tradeoff between redundancy and reliability in the design. We also highlight errors in analytically computed reliability bounds, recently published for the same case study.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Norman, Dr Gethin
Authors: Norman, G., Parker, P., Kwiatkowska, M., and Shukla, S.
College/School:College of Science and Engineering > School of Computing Science
Journal Name:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Publisher:Institute of Electrical and Electronics Engineers
ISSN:0278-0070
ISSN (Online):1937-4151
First Published:First published in IEEE Transactions on Computer-Aided Design of Integrated Circuits 2005 24(10):1629-1637
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

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