Evaluating the reliability of NAND multiplexing with PRISM

Norman, G. , Parker, P., Kwiatkowska, M. and Shukla, S. (2005) Evaluating the reliability of NAND multiplexing with PRISM. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 24(10), 1629 -1637. (doi: 10.1109/TCAD.2005.852033)

Abstract

Probabilistic-model checking is a formal verification technique for analyzing the reliability and performance of systems exhibiting stochastic behavior. In this paper, we demonstrate the applicability of this approach and, in particular, the probabilistic-model-checking tool PRISM to the evaluation of reliability and redundancy of defect-tolerant systems in the field of computer-aided design. We illustrate the technique with an example due to von Neumann, namely NAND multiplexing. We show how, having constructed a model of a defect-tolerant system incorporating probabilistic assumptions about its defects, it is straightforward to compute a range of reliability measures and investigate how they are affected by slight variations in the behavior of the system. This allows a designer to evaluate, for example, the tradeoff between redundancy and reliability in the design. We also highlight errors in analytically computed reliability bounds, recently published for the same case study.

• Item Type: Articles
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Norman, Dr Gethin
• Authors: Norman, G., Parker, P., Kwiatkowska, M., and Shukla, S.
• College/School: College of Science and Engineering > School of Computing Science
• Journal Name: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
• Publisher: Institute of Electrical and Electronics Engineers
• ISSN: 0278-0070
• ISSN (Online): 1937-4151
• First Published: First published in IEEE Transactions on Computer-Aided Design of Integrated Circuits 2005 24(10):1629-1637
• Publisher Policy: Reproduced in accordance with the copyright policy of the publisher