A compact test structure for characterisation of leakage currents in sub-micron CMOS technologies

Ning, Z., Sneyders, Y., Vanderbauwhede, W. , Gillon, R., Tack, M. and Raes, P. (2001) A compact test structure for characterisation of leakage currents in sub-micron CMOS technologies. Microelectronics Reliability, 41(12), pp. 1939-1945. (doi: 10.1016/S0026-2714(01)00100-7)

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Vanderbauwhede, Professor Wim
Authors: Ning, Z., Sneyders, Y., Vanderbauwhede, W., Gillon, R., Tack, M., and Raes, P.
Subjects:Q Science > QA Mathematics > QA75 Electronic computers. Computer science
College/School:College of Science and Engineering > School of Computing Science
Journal Name:Microelectronics Reliability
ISSN:0026-2714

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