Si(1 1 1)-H(1×1): a mirror for atoms characterized by AFM, STM, He and H2 diffraction

Barredo, D. et al. (2007) Si(1 1 1)-H(1×1): a mirror for atoms characterized by AFM, STM, He and H2 diffraction. Surface Science, 601(1), pp. 24-29. (doi: 10.1016/j.susc.2006.08.048)

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AFM, STM and diffraction of He and H<sub>2</sub> have been used to assess Si(1 1 1)–H(1 × 1) surfaces for their potential as mirrors for matter-waves. The H-passivated samples are produced by wet-chemical methods and delivered to a different laboratory for diffraction measurements. We show that the surface is flat and homogenous over lateral scales of microns and that absolute He and H<sub>2</sub> reflectivities of the order of ∼3% are obtained, even after 20 h storage under Ar and several days storage in UHV. These characteristics allow the use of Si(1 1 1)–H(1 × 1) as a highly reflective mirror for atoms and molecules, with application in a future He microscope or focused hydrogen nano-lithography system.

Item Type:Articles
Keywords:Atom-solid interactions, scattering, diffraction, atomic force microsopy, scanning tunneling microscopy, sillicon.
Glasgow Author(s) Enlighten ID:MacLaren, Dr Donald
Authors: Barredo, D., Calleja, F., Weeks, A.E., Nieto, P., Hinarejos, J.J., Laurent, G., Vazquez de Parga, A.L., MacLaren, D.A., Farías, D., Allison, W., and Miranda, R.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
University Centres > Glasgow Materials Research Initiative
Journal Name:Surface Science
ISSN (Online):1879-2758
Published Online:29 September 2006

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