Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon

Johnson, N.P., Khokhar, A.Z., Chong, H.M.H., De La Rue, R.M. and McMeekin, S. (2006) Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon. Electronics Letters, 42(19), pp. 1117-1119. (doi:10.1049/el:20062212)

Johnson, N.P., Khokhar, A.Z., Chong, H.M.H., De La Rue, R.M. and McMeekin, S. (2006) Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon. Electronics Letters, 42(19), pp. 1117-1119. (doi:10.1049/el:20062212)

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Publisher's URL: http://dx.doi.org/10.1049/el:20062212

Abstract

The infrared reflectance spectra at normal incidence for split-ring resonator arrays fabricated in thin films of three different metals on a silicon substrate are reported. The results are compared with a finite difference time domain simulation of the structures and a simple and novel equivalent-circuit method for the calculation of the first and second resonant wavelengths.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Johnson, Dr Nigel and De La Rue, Professor Richard
Authors: Johnson, N.P., Khokhar, A.Z., Chong, H.M.H., De La Rue, R.M., and McMeekin, S.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Electronics Letters
Publisher:The Institution of Engineering & Technology
ISSN:0013-5194
ISSN (Online):1350-911X
Copyright Holders:Copyright © 2006 Institution of Engineering and Technology
First Published:First published in Electronics Letters 42(19):1117-1119
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher.

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