Focusing elements and design considerations for a scanning helium microscope (SHeM)

MacLaren, D.A. , Holst, B., Riley, D.J. and Allison, W. (2003) Focusing elements and design considerations for a scanning helium microscope (SHeM). Surface Review and Letters, 10(2-3), pp. 249-255. (doi:10.1142/S0218625X03005062)

MacLaren, D.A. , Holst, B., Riley, D.J. and Allison, W. (2003) Focusing elements and design considerations for a scanning helium microscope (SHeM). Surface Review and Letters, 10(2-3), pp. 249-255. (doi:10.1142/S0218625X03005062)

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Abstract

We describe recent developments in the fabrication of an atom-optical mirror for focusing thermal helium atoms. A bent silicon crystal is, in principle, capable of high intensity, low aberration helium reflection; manipulation of the mirror's macrostructure minimizes optical aberrations in the device whilst chemical control over the mirror's microstructure ensures high intensity reflection. Incorporation of the atom mirror into a novel Scanning Helium Microscope (SHeM) is outlined, in the context of surface-structural studies. In particular, we refer to the expected operation, contrast mechanisms and resolution of such an instrument.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:MacLaren, Dr Donald
Authors: MacLaren, D.A., Holst, B., Riley, D.J., and Allison, W.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Surface Review and Letters
ISSN:0218-625X
ISSN (Online):1793-6667

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