Microscopy with atomic beams: contrast in a scanning helium microscope

MacLaren, D.A. and Allison, W. (2004) Microscopy with atomic beams: contrast in a scanning helium microscope. Institute of Physics Conference Series, 179, pp. 383-388.

MacLaren, D.A. and Allison, W. (2004) Microscopy with atomic beams: contrast in a scanning helium microscope. Institute of Physics Conference Series, 179, pp. 383-388.

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Abstract

Helium atoms are an established, non-invasive probe of surfaces. The interaction between the atom and the surface, in the thermal energy regime, is predominantly one of elastic scattering that gives surface sensitivity without perturbation to the electronic or physical properties of the surface itself. Recent work has been directed at beam focusing, with the aim of creating a microprobe. All the key atom-optical components necessary for the construction of a scanning helium microscope (SHeM) are now in place and such a microscope is currently under development. We present an overview of the technique, with particular reference to the potential contrast mechanisms.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:MacLaren, Dr Donald
Authors: MacLaren, D.A., and Allison, W.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Institute of Physics Conference Series

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