Statistical device variability and its impact on low power digital circuit design

Asenov, A. (2008) Statistical device variability and its impact on low power digital circuit design. In: Proceeding FTFC 2008, Louvain La Neuve, Belgium, 27-28 May 2008, pp. 29-34.

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Item Type:Conference Proceedings
Keywords:Device, devices, power
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Asenov, Professor Asen
Authors: Asenov, A.
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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