Asenov, A. et al. (2008) Advanced simulation of statistical variability and reliability in nano CMOS transistors. In: IEDM 2008. IEEE International Electron Devices Meeting, 2008, San Francisco, CA, 15-17 Dec 2008, p. 421. ISBN 9781424423774 (doi:10.1109/IEDM.2008.4796712)
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| Item Type: | Conference Proceedings |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Wang, Dr Xingsheng and Millar, Dr Campbell and Roy, Dr Gareth and Asenov, Professor Asen and Brown, Dr Richard and Riddet, Mr Craig and Alexander, Dr Craig and Kovac, Mr Urban and Cheng, Dr Binjie and Martinez, Dr Antonio and Roy, Professor Scott |
| Authors: | Asenov, A., Roy, S., Brown, R., Roy, G., Alexander, C., Riddet, C., Millar, C., Cheng, B., Martinez, A., Seoane, N., Reid, D., Bukhori, M.F., Wang, X., and Kovac, U. |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Publisher: | IEEE |
| ISBN: | 9781424423774 |
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