Advanced simulation of statistical variability and reliability in nano CMOS transistors

Asenov, A. et al. (2008) Advanced simulation of statistical variability and reliability in nano CMOS transistors. In: IEDM 2008. IEEE International Electron Devices Meeting, 2008, San Francisco, CA, 15-17 Dec 2008, p. 421. ISBN 9781424423774 (doi:10.1109/IEDM.2008.4796712)

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Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Wang, Dr Xingsheng and Millar, Dr Campbell and Roy, Dr Gareth and Asenov, Professor Asen and Brown, Dr Richard and Riddet, Mr Craig and Alexander, Dr Craig and Kovac, Mr Urban and Cheng, Dr Binjie and Martinez, Dr Antonio and Roy, Professor Scott
Authors: Asenov, A., Roy, S., Brown, R., Roy, G., Alexander, C., Riddet, C., Millar, C., Cheng, B., Martinez, A., Seoane, N., Reid, D., Bukhori, M.F., Wang, X., and Kovac, U.
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Publisher:IEEE
ISBN:9781424423774

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