Asenov, A. et al. (2008) Advanced simulation of statistical variability and reliability in nano CMOS transistors. In: IEDM 2008. IEEE International Electron Devices Meeting, 2008, San Francisco, CA, 15-17 Dec 2008, p. 421. ISBN 9781424423774 (doi: 10.1109/IEDM.2008.4796712)
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| Item Type: | Conference Proceedings |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Alexander, Dr Craig and Kovac, Mr Urban and Millar, Dr Campbell and Roy, Dr Gareth and Cheng, Dr Binjie and Roy, Professor Scott and Wang, Dr Xingsheng and Asenov, Professor Asen and Brown, Dr Richard and Riddet, Mr Craig and Martinez, Dr Antonio |
| Authors: | Asenov, A., Roy, S., Brown, R., Roy, G., Alexander, C., Riddet, C., Millar, C., Cheng, B., Martinez, A., Seoane, N., Reid, D., Bukhori, M.F., Wang, X., and Kovac, U. |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Publisher: | IEEE |
| ISBN: | 9781424423774 |
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