Kamsani, N.A., Cheng, B., Roy, S. and Asenov, A. (2008) Statistical circuit simulation with the effect of random discrete dopants in nanometer MOSFET devices. In: Design Automation and Test in Europe: Workshop W2, Impact of Process Variability on Design and Test, Munich, Germany, 10-14 March 2008,
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Item Type: | Conference Proceedings |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Cheng, Dr Binjie and Roy, Professor Scott and Asenov, Professor Asen |
Authors: | Kamsani, N.A., Cheng, B., Roy, S., and Asenov, A. |
Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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