Supporting statistical semiconductor device analysis using EGEE and OMII-UK middleware

Reid, D., Millar, C., Asenov, A. , Roy, S., Roy, G., Sinnott, R.O. and Stewart, G. (2008) Supporting statistical semiconductor device analysis using EGEE and OMII-UK middleware. In: EGEE User Conference, Clermond Ferrand, France, Feb 2008,

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Item Type:Conference Proceedings
Keywords:Device
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Sinnott, Professor Richard and Roy, Dr Gareth and Asenov, Professor Asen and Roy, Professor Scott
Authors: Reid, D., Millar, C., Asenov, A., Roy, S., Roy, G., Sinnott, R.O., and Stewart, G.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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