Reid, D., Millar, C., Asenov, A. , Roy, S., Roy, G., Sinnott, R.O. and Stewart, G. (2008) Supporting statistical semiconductor device analysis using EGEE and OMII-UK middleware. In: EGEE User Conference, Clermond Ferrand, France, Feb 2008,
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Device |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Roy, Dr Gareth and Roy, Professor Scott and Sinnott, Professor Richard and Asenov, Professor Asen |
| Authors: | Reid, D., Millar, C., Asenov, A., Roy, S., Roy, G., Sinnott, R.O., and Stewart, G. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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