Statistical-variability compact-modeling strategies for BSIM4 and PSP

Cheng, B.J., Dideban, D., Moezi, N., Millar, C., Roy, G., Wang, X., Roy, S. and Asenov, A. (2010) Statistical-variability compact-modeling strategies for BSIM4 and PSP. IEEE Design and Test of Computers, 27(2), pp. 26-35. (doi: 10.1109/MDT.2010.53)

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Abstract

The strategy to generate statistical model parameters is essential for variability-aware design. Based on 3D atomistic simulation results, this article evaluates the accuracy of statistical parameter generation for two industry-standard compact device models.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Wang, Dr Xingsheng and Millar, Dr Campbell and Roy, Dr Gareth and Asenov, Professor Asen and Cheng, Dr Binjie and Roy, Professor Scott
Authors: Cheng, B.J., Dideban, D., Moezi, N., Millar, C., Roy, G., Wang, X., Roy, S., and Asenov, A.
Subjects:Q Science > QA Mathematics > QA75 Electronic computers. Computer science
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:IEEE Design and Test of Computers
ISSN:0740-7475
ISSN (Online):1558-1918

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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
421321Meeting the design challenges of the nano CMOS electronicsAsen AsenovEngineering & Physical Sciences Research Council (EPSRC)EP/E003125/1Electronic and Nanoscale Engineering