Design and fabrication of high quality-factor 1-d photonic crystal/photonic wire extended microcavities

Md Zain, A.R., Johnson, N.P., Sorel, M. and De La Rue, R.M. (2010) Design and fabrication of high quality-factor 1-d photonic crystal/photonic wire extended microcavities. IEEE Photonics Technology Letters, 22(9), pp. 610-612. (doi: 10.1109/LPT.2010.2040978)

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Abstract

We have successfully demonstrated experimentally the fabrication and measurement of high quality-factor one-dimensional photonic crystal/photonic wire extended cavities based on silicon-on-insulator. The cavities that we have investigated ranged from 3 to 8 m in length. A quality-factor of nearly 74 000 was measured at a cavity length of 5 m through the use of tapering both within and outside the cavity, showing good agreement with the finite-difference time-domain simulation approach used

Item Type:Articles
Additional Information:(c) 2010 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works
Keywords:Crystal microcavities, design fabrication, integrated optics, photonic crystals (phcs), photonic wires (phws), physics, silicon-on-insulator (soi), simulation, wave-guides
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Johnson, Dr Nigel and Sorel, Professor Marc and De La Rue, Professor Richard and md zain, mr ahmad rifqi
Authors: Md Zain, A.R., Johnson, N.P., Sorel, M., and De La Rue, R.M.
Subjects:T Technology > T Technology (General)
Q Science > QC Physics
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:IEEE Photonics Technology Letters
Journal Abbr.:IEEE photonics technol. lett.
Publisher:IEEE
ISSN:1041-1135
Copyright Holders:Copyright © 2010 IEEE
First Published:First published in IEEE Photonics Technology Letters 2010 22(9):610-612
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

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