Characterization of all-optical regeneration potentials of a bistable semiconductor ring laser

Li, B., Memon, M.I., Mezosi, G., Wang, Z.R., Sorel, M. and Yu, S.Y. (2009) Characterization of all-optical regeneration potentials of a bistable semiconductor ring laser. Journal of Lightwave Technology, 27(19), pp. 4233-4240. (doi: 10.1109/JLT.2009.2023087)

Abstract

All-optical pulse reamplification, reshaping (2R), and retiming (3R) using a monolithic bistable semiconductor ring laser (SRL) is demonstrated for the first time. The regeneration performance of the SRL is characterized with an all-optical settable switching threshold, achieving significant increases in the extinction ratio (ER) of the output pulse for input ER as low as 1 dB. For retiming, a rectangular retiming window generated by a clean clock signal is used to eliminate the timing jitter in the input pulse. For input pulse with peak-to-peak timing jitter as high as similar to 12% of the bit period, the timing jitter in the retimed output pulse is reduced to < 2% of the bit period. The pulsewidth of the final regenerated data can be controlled by changing the width of the retiming window. The SRL is, therefore, shown to have a "hard" digital performance in both amplitude and time domain suitable for all-optical 3R

• Item Type: Articles
• Keywords: 3R regenerator, all-optical, amplifier, bistability, engineering, England, interferometer, laser, memory cell, modulation, performance, potentials, ratio, rectangular retiming window, regeneration, retiming (3R), semiconductor, semiconductor ring laser, semiconductor ring lasers (SRL), threshold, wavelength conversion
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Mezosi, Mr Gabor and Sorel, Professor Marc
• Authors: Li, B., Memon, M.I., Mezosi, G., Wang, Z.R., Sorel, M., and Yu, S.Y.
• College/School: College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
• Journal Name: Journal of Lightwave Technology
• Publisher: IEEE
• ISSN: 0733-8724
• ISSN (Online): 1558-2213