Green function study of quantum transport in ultra-small devices with embedded atomistic clusters

Barker, J.R., Martinez, A., Svizhenko, A., Anantram, A. and Asenov, A. (2006) Green function study of quantum transport in ultra-small devices with embedded atomistic clusters. Journal of Physics: Conference Series, 35, pp. 233-246. (doi: 10.1088/1742-6596/35/1/021)

Abstract

Transport in limiting scale MOSFET transistors will be strongly influenced by quantum effects and the presence of atomistic scattering centres either intentionally or un-intentionally present in the channel and the device environs. The scattering in such systems is non-asymptotic and the selfaveraging conditions of the Kohn-Luttinger theorem fail so that a self-energy for impurity scattering does not exist. Atomistic scattering must therefore be treated non-perturbatively. Previously it has been shown that quantized micro-vortices may occur at definite energies in the current flow contributing to both the blocking effect and to effective mobility. The present study uses the Glasgow and NASA NEGF simulators to study vortex formation and tunnelling through small clusters of atomistic impurities arranged with various configurations within the 5 nm wide by 12 nm long channel of a Double Gate MOSFET. The I-V characteristics and the threshold voltage are severely affected by the distribution of the charges in the channel. A variety of different geometry atomistic clusters have been studied. Examination of the energy dependent current density allows an evaluation of the admixture of strong quantum flows such as micro-vortices to the net current. It is found that the threshold voltage and conductance are strongly dependent on the impurity configuration. The I-V characteristics are monotonic in most cases due to the strong thermal smoothing that prevents resolution of the mode structure.

• Item Type: Articles
• Keywords: Atomistic, channel, charge, clusters, conductance, density, device, devices, double gate mosfet, flow, fluctuations, gate, green function, impurities, long, mobility, mode, mosfet, nanotransistors, quantum, quantum transport, resolution, scale, scattering, semiconductor-devices, sub-100 nm mosfets, system, systems, transistors, transport
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Barker, Professor John and Asenov, Professor Asen and Martinez, Dr Antonio
• Authors: Barker, J.R., Martinez, A., Svizhenko, A., Anantram, A., and Asenov, A.
• Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
• College/School: College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
• Journal Name: Journal of Physics: Conference Series
• ISSN: 1742-6588
• ISSN (Online): 1742-6596