A 3D finite element parallel simulator for studying fluctuations in advanced MOSFETs

Asenov, A. (2006) A 3D finite element parallel simulator for studying fluctuations in advanced MOSFETs. In: 11th International Workshop on Computational Electronics, IWCE 2006, Vienna, Austria, p. 37.

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Item Type:Conference Proceedings
Keywords:Fluctuation, Fluctuations, HEMT, Impact, Interface, Intrinsic Parameter Fluctuations, Model, MOSFET, MOSFETS, Scattering, Simulation
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Asenov, Professor Asen
Authors: Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Publisher:IEEE

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