Asenov, A., Brown, A., Roy, G., Alexander, C. and Martinez, A. (2006) Simulation of Atomic Scale Effects and Fluctuations in nano-scale CMOS. In: International Conference on Solid State Devices and Materials. (SSDM 2006)., Yokohama,Japan,
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Item Type: | Conference Proceedings |
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Keywords: | CMOS, Device, Devices, Fluctuation, Fluctuations, Interface, Random Dopants, Scale, Simulation |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Roy, Dr Gareth and Asenov, Professor Asen and Brown, Mr Andrew and Alexander, Dr Craig and Martinez, Dr Antonio |
Authors: | Asenov, A., Brown, A., Roy, G., Alexander, C., and Martinez, A. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Publisher: | THE JAPAN SOCIETY OF APPLIED PHYSICS |
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