Simulation of Atomic Scale Effects and Fluctuations in nano-scale CMOS

Asenov, A., Brown, A., Roy, G., Alexander, C. and Martinez, A. (2006) Simulation of Atomic Scale Effects and Fluctuations in nano-scale CMOS. In: International Conference on Solid State Devices and Materials. (SSDM 2006)., Yokohama,Japan,

Full text not currently available from Enlighten.


Item Type:Conference Proceedings
Keywords:CMOS, Device, Devices, Fluctuation, Fluctuations, Interface, Random Dopants, Scale, Simulation
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Roy, Dr Gareth and Asenov, Professor Asen and Brown, Mr Andrew and Alexander, Dr Craig and Martinez, Dr Antonio
Authors: Asenov, A., Brown, A., Roy, G., Alexander, C., and Martinez, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Publisher:THE JAPAN SOCIETY OF APPLIED PHYSICS

University Staff: Request a correction | Enlighten Editors: Update this record