Simulation of Atomic Scale Effects and Fluctuations in nano-scale CMOS

Asenov, A., Brown, A., Roy, G., Alexander, C. and Martinez, A. (2006) Simulation of Atomic Scale Effects and Fluctuations in nano-scale CMOS. In: International Conference on Solid State Devices and Materials. (SSDM 2006)., Yokohama,Japan,

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Item Type:Conference Proceedings
Keywords:CMOS, Device, Devices, Fluctuation, Fluctuations, Interface, Random Dopants, Scale, Simulation
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Roy, Dr Gareth and Brown, Mr Andrew and Alexander, Dr Craig and Asenov, Professor Asen and Martinez, Dr Antonio
Authors: Asenov, A., Brown, A., Roy, G., Alexander, C., and Martinez, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Publisher:THE JAPAN SOCIETY OF APPLIED PHYSICS

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