Alexander, C., Roy, G. and Asenov, A. (2006) Increased intrinsic parameter fluctuations through ab initio Monte Carlo simulations in nano-scaled MOSFETs. In: International Electron Devices Meeting 2006, IEDM, San Fransisco, CA, USA,
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Device, Devices, Electron, Fluctuation, Fluctuations, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, Monte Carlo, Monte Carlo Simulation, Monte Carlo Simulations, Monte-Carlo-Simulation, MOSFET, MOSFETS, Parameter Fluctuations, Simulation |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Roy, Dr Gareth and Asenov, Professor Asen and Alexander, Dr Craig |
| Authors: | Alexander, C., Roy, G., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Publisher: | IEEE |
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