Yang, L., Watling, J., Barker, J. and Asenov, A. (2005) The impact of soft-optical phonon scattering due to high-kappa dielectrics on the performance of sub-100nm conventional and strained Si n-MOSFETs. In: Physics of Semiconductors AIP Conference Proceedings, Melville, pp. 1497-1498. ISBN 0094-243X
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Channel, Channels, Degradation, Device, Devices, Dielectrics, Drive, Electron-Mobility, Gate, High-Kappa, Impact, Inversion-Layers, Mobility, Monte Carlo, Monte Carlo Simulation, MOSFET, MOSFETS, N-MOSFETS, Performance, Scatter |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Barker, Professor John and Watling, Dr Jeremy and Asenov, Professor Asen |
| Authors: | Yang, L., Watling, J., Barker, J., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Publisher: | AMER INST PHYSICS |
| ISBN: | 0094-243X |
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