Watling, J., Brown, A., Alexander, C., Ferrari, G., Barker, J., Bersuker, G., Zeitzoff, P. and Asenov, A. (2005) Electrostatic and transport variations in nano CMOS devices due to variations in high-k oxides. In: 2nd International Workshop on Advanced Gate Stack Technology, Texas, USA,
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Item Type: | Conference Proceedings |
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Keywords: | 2nd, CMOS, Device, Devices, Gate, High-K, Oxide, Technology, Transport |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Barker, Professor John and Asenov, Professor Asen and Brown, Mr Andrew and Alexander, Dr Craig and Watling, Dr Jeremy |
Authors: | Watling, J., Brown, A., Alexander, C., Ferrari, G., Barker, J., Bersuker, G., Zeitzoff, P., and Asenov, A. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Publisher: | SEMATECH |
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