Intrinsic parameter fluctuations in conventional MOSFETs until the end of the ITRS

Roy, G., Adamu-Lema, F., Brown, A., Roy, S. and Asenov, A. (2005) Intrinsic parameter fluctuations in conventional MOSFETs until the end of the ITRS. In: New Phenomena in Mesoscopic Structures - 7 (NPMS) and the fifth in the series of Surfaces and Interfaces of Mesoscopic Devices (SIMD), NPMS-7/SIMD-5, Maui, Hawaii,

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Item Type:Conference Proceedings
Keywords:Device, Devices, Fluctuation, Fluctuations, Interface, Interfaces, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, MOSFET, MOSFETS, Parameter Fluctuations, Surface, Surfaces
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Roy, Dr Gareth and Brown, Mr Andrew and Roy, Professor Scott and Asenov, Professor Asen
Authors: Roy, G., Adamu-Lema, F., Brown, A., Roy, S., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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