Simulation of combined sources of intrinsic parameter fluctuations in 'real' 35nm MOSFET

Roy, G., Adamu-Lema, F., Brown, A., Roy, S. and Asenov, A. (2005) Simulation of combined sources of intrinsic parameter fluctuations in 'real' 35nm MOSFET. In: European Solid-State Device Research Conference 2005 - ESSDERC2005, Grenoble, France,

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Item Type:Conference Proceedings
Keywords:Device, Fluctuation, Fluctuations, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, MOSFET, Parameter Fluctuations, Simulation
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Roy, Dr Gareth and Brown, Mr Andrew and Roy, Professor Scott and Asenov, Professor Asen
Authors: Roy, G., Adamu-Lema, F., Brown, A., Roy, S., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Publisher:IEEE

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